rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Volume one hundred and ninety three
  title info:
    title: Advances in imaging and electron physics
    part number: Volume 193
  name:
    name part: Hawkes, P. W.
    role:
      role term: editor.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: ne
    date issued: 2016
    copyright date: 2016
    edition: First edition.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xiii, 140 pages) : illustrations (some color).
  abstract: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field.
  table of contents: 1. Utilizing the Eigen-Emittance Concept for Bright Electron Beams / Alex J. Dragt -- 1. Introduction -- 2. Theory -- 3. Construction of Initial Distributions -- 4. Applications to Bright Electron Beams -- 5. Summary and Discussion -- References -- 2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers / Igor Spivak-Lavrov -- 1. Introduction -- 2. Analytical Equations for Calculating the Dynamics of the Charged Particle Beam and Their General Properties -- 3. Analytical Methods of Calculating 2D Fields and Fields Reduced to the 2D Ones -- 4. Numerical Calculation of Instrument Characteristics of Static and TOF Mass Spectrometers -- 5. Summary and Conclusions.
  note: edited by Peter W. Hawkes.
  note: Includes bibliographical references at the end of each chapters and index.
  note: English.
  subject:
    topic: Electrons
  subject:
    topic: Image processing
  subject:
    topic: Electronics
  subject:
    topic: Électrons
  subject:
    topic: Traitement d'images
  subject:
    topic: Électronique
  subject:
    topic: image processing
  subject:
    topic: electronic engineering
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Mechanical
  subject:
    topic: SCIENCE
    topic: Life Sciences
    topic: Botany
  subject:
    topic: Image processing
  subject:
    topic: Electronics
  subject:
    topic: Electrons
  subject:
    topic: Nuclear physics
  classification: QC793.5.E62 A383 2016eb
  classification: 581.35
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume one hundred and ninety one
    origin info:
      edition: First edition
  related item:
    title info:
      title: Advances in imaging and electron physics
  identifier: 9780128052310
  identifier: 0128052317
  identifier: 9780128048153
  identifier: 0128048158
  identifier: 9780128052303
  identifier: 0128052309
  identifier: 892957 MIL
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 160204
    record change date: 20260327150022.3
    record identifier: in00005759955
    language of cataloging:
      language term: eng