Cover Image

Materials and process characterization /

Materials and Process Characterization.

Bibliographic Details
Corporate Author:	ScienceDirect (Online service)
Other Authors:	Einspruch, Norman G. (Editor), Larrabee, Graydon B., 1932- (Editor)
Format:	eBook
Language:	English
Published:	New York : Academic Press, 1983.
Series:	VLSI electronics ; volume 6.
Subjects:	Integrated circuits > Very large scale integration. Microelectronics > Materials. Production engineering. Circuits intégrés à très grande échelle. Microélectronique > Matériaux. Technique de la production. TECHNOLOGY & ENGINEERING > Mechanical. Integrated circuits > Very large scale integration Microelectronics > Materials Production engineering Electronic books.
Online Access:	Connect to the full text of this electronic book

Similar Items

VLSI electronics : microstructure science /
Published: (1981)

VLSI electronics. microstructure science /
Published: (1982)

Design automation, languages, and simulations /
Published: (2003)

VLSI electronics : microstructure science, volume 7 /
Published: (1983)

VLSI : circuits for emerging applications /
Published: (2015)

VLSI electronics : microstructure science, volume 4 /
Published: (1982)

VLSI electronics : microstructure science, volume 5 /
Published: (1982)

VLSI test principles and architectures : design for testability /
Published: (2006)

VLSI reliability /
by: Sabnis, Anant G.
Published: (1990)

1988 Symposium on VLSI Technology : digest of technical papers, May 10-13, 1988, San Diego.
Published: (1988)

Digest of technical papers : 1987 Symposium on VLSI Technology, May 18-21, 1987, Karuizawa /
Published: (1987)

The bounding approach to VLSI circuit simulation /
by: Zukowski, Charles A.
Published: (1986)

Semi-custom IC design and VLSI /
Published: (1983)

Introduction to VLSI systems : a logic, circuit, and system perspective /
by: Lin, Ming-Bo
Published: (2012)

VLSI and computer architecture /
by: Shankar, Ravi
Published: (1989)

VLSI test principles and architectures : design for testability /
Published: (2006)

VLSI design environments /
Published: (2000)

Surface and interface effects in VLSI /
Published: (1985)

In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland /
Published: (1999)

Handbook of VLSI microlithography : principles, technology, and applications /
Published: (1991)

Silicides for VLSI applications /
by: Murarka, S. P.
Published: (1983)

Analog and VLSI circuits /
Published: (2009)

Graphene and VLSI Interconnects /
by: Tan, Cher Ming, 1959-
Published: (2022)

3D integration in VLSI circuits : implementation technologies and applications /
by: Sakuma, Katsuyuki
Published: (2018)

Process and equipment control in microelectronic manufacturing : 19-20 May 1999, Edinburgh, Scotland /
Published: (1999)

Advancing VLSI through machine learning : innovations and research /
Published: (2025)

Lithography for VLSI /
Published: (1987)

Handbook of VLSI microlithography : principles, technology, and applications /
Published: (2001)

Thermal-aware testing of digital VLSI circuits and systems /
by: Chattopadhyay, Santanu
Published: (2018)

The VLSI handbook /
Published: (2007)

VLSI technology /
Published: (2003)

Logic design /
Published: (2003)

Microelectronic materials and processes : [proceedings of the NATO Advanced Study Institute on Microelectronic Materials and Processes, Il Ciocco, Castelvecchio Pascoli, Italy, June 30-July 11, 1986] /
Published: (1989)

Multilevel interconnect technology /
by: Rao, Gopal K.
Published: (1993)

Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October 1996, Austin, Texas /
Published: (1996)

Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October 1997, Austin, Texas /
Published: (1997)

Microelectronic manufacturing yield, reliability, and failure analysis : 25-26 October, 1995, Austin, Texas /
Published: (1995)

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September 1998, Santa Clara, California /
Published: (1998)

VLSI handbook /
Published: (1985)

Integrated circuit defect-sensitivity : theory and computational models /
by: Pineda de Gyvez, José
Published: (1993)