rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: International progress in precision engineering
    sub title: proceedings of the 7th International Precision Engineering Seminar, Kobe, Japan, May 1993
  name:
    name part: International Precision Engineering Seminar 1993 : Kobe-shi, Japan)
    role:
      role term: creator
  name:
    name part: Ikawa, N. (Naoya)
    role:
      role term: editor.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: conference publication
  genre: Electronic books.
  genre: Congress
  genre: proceedings (reports)
  genre: Conference papers and proceedings
  genre: Conference papers and proceedings.
  genre: Actes de congrès.
  origin info:
    place:
      place term: mau
    date issued: 1993
    copyright date: 1993
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (1091 pages) : illustrations
  abstract: International Progress in Precision Engineering documents the proceedings of the 7th International Precision Engineering Seminar held in Kobe, Japan, May 1993. The seminar brought together the world's leading precision engineering practitioners from areas of application as diverse as sensors, actuators, scanning tip microscopy, micro and nano machining (including bio-machining), ultra precision measuring machines, machine tools, and large optics for space technology. The seminar included 10 oral sessions that dealt with the following topics: (I) Metrology - The Science Base For Precision Engin.
  table of contents: Front Cover; International Progress in Precision Engineering; Copyright Page; Table of Contents; Foreword; Chapter 1. Precision Engineering and its Impact on the Electronics Industry: Past, Present, and Future; Essential Elements of Home Electronics Products; The Computer; Progress of LSI Technology & Devices; Predictions for IC Technology In the 90s; The VCR/Camera-Recorder; Japan's Contributions to the Precision Engineering Field; Product Evolution and Bearing Speed/Precision; Challenges for Micro-Fine Production Engineering
  table of contents: Chapter 2. Limitations of interpolation accuracy in heterodyneinterferometryAbstract; 1. Introduction; 2. Interference phase measurement; Conclusions; References; Chapter 3. A New Ultra Precision Instrument for Calibration ofGauges and Measurements of High-Quality Products; 1. Introduction; 2. Basic Investigations; 3. Final Design; 4. Results; Chapter 4.Correctness of assessment software in coordinate metrology; 1.Introduction; 2.Current scene; 3.The way forward; 4.Conclusions; References; Chapter 5. Concept for the Traceability of Measurementswith Coordinate Measuring Machines
  table of contents: 1.Traceability of a Coordinate Measuring Machine2.State of the art; 3.Virtual CMM method; 5. Maintaining the validity of a calibration; 6.The use of calibrated CMMs; 7.Conclusions and future developments; Bibliography; Chapter 6. A Six-Degrees of FreedomFine Motion Mechanism; Abstract; 1. Introduction; 2. Experimental mechanism; 3. Multi-dof motions; 4. Reduction of influence of an inertia load; 5. Conclusions; 6. Reference; Chapter 7. Three Dimensional Position Sensor Using Optical Collimator for NanometerResolution; 1.Introduction; 2. Theory of reflection by sphere
  table of contents: 3.Detection of in-plane displacements4.Conclusions; References; Chapter 8. Laser Photo-etching Method for Maskless Fabrication of a Through-Hole Contact (THC) Amorphous Silicon (a-Si) Solar CellSubmodule; Abstract; 1.Introduction; 2. THC Integrated-type a-Si SolarCell; 3.Laser Photo-etching Method; 4.Output Performance; 5.Conclusion; Acknowledgement; References; Chapter 9. Plasma CVM (Chemical Vaporization Machining) -- A Chemical Machining Method With Equal Performances toConventional Mechanical Methods from the Sense of Removal Rates and Spatial Resolutions; Abstract; 1. Introduction
  table of contents: 2. Basic concepts of PlasmaCVM3· Cutting application; 4. Polishing application; 5. Summery; Chapter 10.BROAD ION BEAM PROCESSING OF LARGE SURFACE AREAS WITH NANOMETER PRECISION; ABSTRACT; INTRODUCTION; PROCESSING; RESULTS; CONCLUSIONS; ACKNOWLEDGEMENTS; REFERENCES; Chapter 11. Principle of Ion Beam Processing and its Applicationto Fine and Precision Fabrication; 1. Introduction; 2 . Concept and mechanism of ion beam machining; 3 . Ion beam machining characteristics; 4. Problems of ion beam machining; 5. Equipment; 6. Application of ionbeam machining; References
  note: N. Ikawa [and others], eds.
  note: Includes bibliographical references at the end of each chapters and index.
  subject:
    topic: Instrument manufacture
    genre: Congresses
  subject:
    topic: Tolerance (Engineering)
    genre: Congresses
  subject:
    topic: Interferometry
    genre: Congresses
  subject:
    topic: Appareils et instruments scientifiques
    topic: Fabrication
    genre: Congrès
  subject:
    topic: Tolérance (Technologie)
    genre: Congrès
  subject:
    topic: Interférométrie
    genre: Congrès
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Technical & Manufacturing Industries & Trades
  subject:
    topic: Instrument manufacture
  subject:
    topic: Interferometry
  subject:
    topic: Tolerance (Engineering)
  classification: TS500 .I52 1993eb
  classification: 681
  related item:
    title info:
      title: International progress in precision engineering : proceedings of the 7th International Precision Engineering Seminar, Kobe, Japan, May 1993
    name:
      name part: International Precision Engineering Seminar (7th : 1993 : Kobe-shi, Japan).
    origin info:
      publisher: Stoneham, Massachusetts : Butterworth-Heinemann, ©1993
  identifier: 9780124158986
  identifier: 0124158986
  identifier: 075069484X
  identifier: 9780750694841
  identifier: CL0500000730 Safari Books Online
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: E7B
    record creation date: 141105
    record change date: 20260326212128.9
    record identifier: in00005757893
    language of cataloging:
      language term: eng