Control of semiconductor interfaces : proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 /
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characteriz...
| Corporate Authors: | , |
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| Other Authors: | , , |
| Format: | Conference Proceeding eBook |
| Language: | English |
| Published: |
Amsterdam ; New York :
Elsevier,
©1994.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in. |
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| Physical Description: | 1 online resource (xv, 583 pages) : illustrations |
| Bibliography: | Includes bibliographical references and indexes. |
| ISBN: | 9781483290485 1483290484 |