rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Modern electronic test equipment
  name:
    name part: Brindley, Keith
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 1990
    edition: Second edition.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (viii, 261 pages)
  abstract: Modern Electronic Test Equipment.
  table of contents: Front Cover; Modern Electronic Test Equipment; Copyright Page; Table of Contents; Preface; Part One: Equipment and Principles; Chapter 1. Introduction; The past; The present; The future; Explanation of terms; Book layout and description; Chapter 2. Analog meters; General-purpose meters; Specialised analog meters; Chapter 3. Digital meters; Signals and functions; Analog-to-digital conversion; Displays; Advantages of digital meters; Chapter 4. Oscilloscopes; What the oscilloscope displays; The basic oscilloscope; Specifications; Oscilloscope accessories; Equipment accuracy; New developments.
  table of contents: Chapter 5. Signal sourcesLow frequency oscillators; Signal generators; Chapter 6. Frequency, time and event counters; High frequency measurement; Low frequency measurement; Equipment and operation; Errors; Chapter 7. Spectrum analysers; Spectrum analyser types; Display characteristics; Equipment specifications and accuracy; Chapter 8. Logic analysers; Features; Main modes of use; Chapter 9. Time domain reflectometers; Metallic time domain reflectometers; Using the metallic time domain reflectometer; Optical time domain reflectometers; Chapter 10. Automatic test equipment.
  table of contents: Basic methods of automatic test equipmentTypes of automatic test equipment; Chapter 11. Buses; Bus data communications levels; V24/EIA232; EIA422/EIA423; EIA449; S100; Multibus; PC expansion bus; STE; VMEbus; GPIB; VXIbus; Part Two: Applications and Measurement Techniques; Chapter 12. Measurands and measurement equipment; Aerials or antennas; Amplifiers (untuned); Capacitance; Current; Diode parameters; Distortion; Frequency; Impedance; Inductance; Light; Noise; Optical fibres; Phase; Pulse parameters; Resistance; SCR parameters; Signal-to-noise ratio; Time; Transmission lines.
  table of contents: Appendix 1: DisplaysAnalog displays -- the moving-coil movement; Analog/digital displays -- the cathode ray tube (CRT); Storage CRT; Digital displays; Appendix 2: Optical fibres; Transmission of light; Optical fibre types.
  note: Keith Brindley.
  subject:
    topic: Electronic instruments
  subject:
    topic: Appareils électroniques
  subject:
    topic: Electronic instruments
  classification: TK7878.4 .B75 1990eb
  classification: 621.3815/48
  related item:
    title info:
      title: Modern electronic test equipment
    name:
      name part: Brindley, Keith.
    origin info:
      edition: Second edition
    identifier: (OCoLC)21410665
  identifier: 9781483279886
  identifier: 148327988X
  identifier: 043490063X
  identifier: 9780434900633
  identifier: 0750616016
  identifier: 9780750616010
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OPELS
    record creation date: 141024
    record change date: 20260326211320.9
    record identifier: in00005757042
    language of cataloging:
      language term: eng