rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Vol. 178
  name:
    name part: Hawkes, P. W.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: ne
    place:
      place term: Amsterdam
    place:
      place term: Boston
    publisher: Academic Press
    date issued: 2013
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource
  abstract: Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
  table of contents: Front Cover; EDITOR-IN-CHIEF; ADVANCES IN IMAGING ANDELECTRON PHYSICS; COPYRIGHT; CONTENTS; PREFACE; FUTURE CONTRIBUTIONS; CONTRIBUTORS; Chapter One -- Generalized Axiomatic Scale-Space Theory; 1. INTRODUCTION; 2. IMAGE MEASUREMENTS AND THE NOTION OF SCALE; 3. STRUCTURAL ASSUMPTIONS OF SCALE-SPACE THEORY; 4. SCALE-SPACE AXIOMS FOR SPATIAL IMAGE DOMAINS; 5. SCALE-SPACE CONCEPTS FOR SPATIAL IMAGE DOMAINS; 6. SCALE-SPACE AXIOMS FOR SPATIOTEMPORAL IMAGE DOMAINS; 7. SCALE-SPACE CONCEPTS FOR SPATIOTEMPORAL IMAGE DOMAINS; 8. TEMPORAL SMOOTHING KERNELS; 9. HISTORY OF AXIOMATIC SCALE-SPACE FORMULATIONS.
  table of contents: 10. SUMMARY AND CONCLUSIONSACKNOWLEDGMENTS; REFERENCES; Chapter Two -- Smoothlet Transform: Theory and Applications; 1. INTRODUCTION; 2. SMOOTHLETS; 3. SMOOTHLET TRANSFORM; 4. IMAGE COMPRESSION; 5. IMAGE DENOISING; 6. SUMMARY; REFERENCES; Chapter Three- Theory and Computation of Electron Mirrors: The Central Particle Method; 1. INTRODUCTION; 2. SYSTEMS WITH A STRAIGHT OPTICAL AXIS; 3. AXIALLY SYMMETRIC CHARGED-PARTICLE OPTICAL SYSTEMS; 4. TIME-OF-FLIGHT MASS SPECTROMETER; 5. ELECTRON MICROSCOPE OBJECTIVE WITH AN ELECTRON MIRROR; 6. SUMMARY AND CONCLUSIONS; ACKNOWLEDGMENTS; REFERENCES; INDEX; Volume 1511.
  table of contents: Volume 152Volume 153; Volume 154; Volume 155; Volume 156; Volume 157; Volume 158; Volume 159; Volume 160; Volume 161; Volume 162; Volume 163; Volume 164; Volume 165; Volume 166; Volume 167; Volume 168; Volume 169; Volume 170; Volume 171; Volume 172; Volume 173; Volume 174; Volume 175; Volume 176; Volume 177.
  note: edited by Peter W. Hawkes.
  note: Includes bibliographical references and index.
  subject:
    topic: Optoelectronic devices
  subject:
    topic: Optical data processing
  subject:
    topic: Dispositifs optoélectroniques
  subject:
    topic: Traitement optique de l'information
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Imaging Systems
  subject:
    topic: Optical data processing
  subject:
    topic: Optoelectronic devices
  classification: TA1750
  classification: 621.367
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume 178
    identifier: (OCoLC)843807635
  identifier: 9780124077294
  identifier: 0124077293
  identifier: 9780124077010
  identifier: 0124077013
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 130702
    record change date: 20260326194928.3
    record identifier: in00005752569
    language of cataloging:
      language term: eng