rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Defect control in semiconductors
    sub title: proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989
    part number: Vol. 2
  name:
    name part: International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
    role:
      role term: creator
  name:
    name part: Sumino, K. (Kōji)
    name part: 1931-
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: conference publication
  genre: Electronic books.
  genre: Congress
  genre: proceedings (reports)
  genre: Conference papers and proceedings
  genre: Conference papers and proceedings.
  genre: Actes de congrès.
  origin info:
    place:
      place term: ne
    place:
      place term: Amsterdam
    place:
      place term: New York
    place:
      place term: New York, N.Y., U.S.A
    publisher: North-Holland
    publisher: Distributors for the U.S. and Canada, Elsevier Science Pub. Co.
    date issued: 1990
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource : illustrations
  abstract: Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below.
  note: edited by K. Sumino.
  note: Includes bibliographical references and indexes.
  subject:
    topic: Semiconductors
    topic: Defects
    genre: Congresses
  subject:
    topic: Materials
    topic: Defects
    genre: Congresses
  subject:
    topic: Semi-conducteurs
    topic: Défauts
    genre: Congrès
  subject:
    topic: Matériaux
    topic: Défauts
    genre: Congrès
  subject:
    topic: Materials
    topic: Defects
  subject:
    topic: Semiconductors
    topic: Defects
  classification: QC611.6.D4 I583 1989eb
  classification: 621.381/52
  related item:
    title info:
      title: Defect control in semiconductors
    name:
      name part: International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan).
    origin info:
      publisher: Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990
    identifier: (DLC) 90042223
    identifier: (OCoLC)22005675
  identifier: 9780444884299
  identifier: 0444884297
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OPELS
    record creation date: 130429
    record change date: 20260326194529.6
    record identifier: in00005752174
    language of cataloging:
      language term: eng