Nonradiative recombination in semiconductors /

In recent years, great progress has been made in the understanding of recombination processes controlling the number of excess free carriers in semiconductors under nonequilibrium conditions. As a result, it is now possible to give a comprehensive theoretical description of these processes. The auth...

Full description

Bibliographic Details
Main Author: Abakumov, V. N., 1936-
Corporate Author: ScienceDirect (Online service)
Other Authors: Perel, V. I. (Vladimir Idelevich), 1928-, Yassievich, I. N., 1936-
Format: eBook
Language:English
Published: Amsterdam ; New York : New York, NY, USA : North-Holland ; Sole distributors for the USA and Canada, Elsevier Science Pub. Co., 1991.
Series:Modern problems in condensed matter sciences ; v. 33.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:In recent years, great progress has been made in the understanding of recombination processes controlling the number of excess free carriers in semiconductors under nonequilibrium conditions. As a result, it is now possible to give a comprehensive theoretical description of these processes. The authors have selected a number of experimental results which elucidate the underlying physical problems and enable a test of theoretical models. The following topics are dealt with: phenomenological theory of recombination, theoretical models of shallow and deep localized states, cascade model of carrier capture by impurity centers, capture restricted by diffusion, multiphonon processes, Auger processes, effect of electric field on capture and thermal emission of carriers.
Item Description:Translated from the Russian.
Physical Description:1 online resource (xvi, 320 pages) : illustrations
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references (pages 283-293) and indexes.
ISBN:9780444600820
0444600825