http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
structural analysis of complex materials
This book focuses on the structural determination of crystalline solids with extensive disorder. Well-established methods exist for characterizing the structure of fully crystalline solids or fully disordered materials such as liquids and glasses, but there is a dearth of techniques for the cases in-between, crystalline solids with internal atomic and nanometer scale disorder. Egami and Billinge discuss how to fill the gap using modern tools of structural characterization. This problem is encountered in the structural characterization of a surprisingly wide range of complex materials of interest to modern technology and is becoming increasingly important. Takeshi Egami received the 2003 Eugene Bertram Warren Diffraction Physics Award for the work described in the book. The authors received 2010 J.D. Hanawalt Award from the International Union of Crystallography largely based on the success of this book Praise for the first edition:Egami and Billinge are experts in the application of PDF analysis and their writing is both clear and insightful. The organisation of the book is also excellent, with illuminating examples provided throughout. If you have an interest in atomic structure of materials, and local structural details in particular, PDF methods can be profoundly useful. I would heartily recommend this book as a starting point if you are considering using PDF analysis in your own work. For more experienced practitioners, this text is a useful reference. Materials Today, June 2004 Introduces a unique method to study the atomic structure of nanomaterialsLays out the basic theory and methods of this important emerging techniqueThe first edition is considered the seminal text on the subject.
Front Cover; Underneath the Bragg Peaks: Structural Analysis of Complex Materials; Copyright; Contents; Preface; References; Preface to the first edition; Chapter 1: Structure of Complex Materials; 1.1. Crystallography and Beyond; 1.1.1. Complexity at the Atomic and Molecular Level; 1.1.2. Local View of the Structure; 1.1.3. Shadow of Bragg's Law: Why Knowing the Crystal Structure Is Not Sufficient; 1.1.4. The Methods of Local Crystallography; 1.1.5. Real and Reciprocal Space; 1.2. The Power of Total Scattering and PDF Methods
2.1.3. DW Approximation2.1.4. Diffuse Scattering; 2.2. Crystallographic Analysis; 2.2.1. Rietveld Refinement Method; 2.2.2. Single Crystal Fourier (Patterson) Analysis; 2.3. Crystallographic Methods and Disorder: Limitations of Crystallographic Methods; 2.3.1. DW Factor; 2.3.2. Values of Refined Parameters I: Imperfect Models; 2.3.3. Values of Refined Parameters II: Correlated Parameters; 2.3.4. Values of Rietveld Refined DW Factors: Caveat Emptor; Appendix2.1. Scattering Cross-Section; Appendix2.2. Sample Scattering Amplitude; A2.2.1. Simple Derivation; A2.2.2. Born Approximation
3.1.3.3. The Radial Distribution Function, R(r)3.1.4. Brief History; 3.1.5. Multicomponent Systems; 3.2. Compositionally Resolved Partial PDF; 3.2.1. Differential PDF; 3.2.2. Anomalous X-Ray Scattering; 3.2.3. Isotopic Substitution; 3.2.4. Joint Total and Differential PDF Studies; 3.3. Magnetic Correlation Functions; 3.3.1. Magnetic Scattering of Neutrons; 3.3.2. Magnetic PDF; 3.4. The PDF in Higher Dimensions; 3.4.1. PDF Defined in Three Dimensions; 3.4.2. Anisotropic PDF; 3.4.3. One-Dimensional PDF and Layer-Layer Correlations; 3.4.4. Two-Dimensional PDF and Intralayer Correlation