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Trap level spectroscopy in amorphous semiconductors /

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Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscop...

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Bibliographic Details
Main Author: Mikla, Victor I.
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: Oxford : Elsevier, 2010.
Series:Elsevier insights.
Subjects:
Amorphous semiconductors > Spectra.
Amorphous semiconductors > Defects > Analysis.
Deep level transient spectroscopy.
Semi-conducteurs amorphes > Spectre.
Semi-conducteurs amorphes > Défauts > Analyse.
Spectroscopie DLTS.
Deep level transient spectroscopy
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniques Discusses the advantages and disadvantages of each technique.
Physical Description:1 online resource
Bibliography:Includes bibliographical references.
ISBN:9780123847157
012384715X