rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Radiation effects, computer experiments
  name:
    name part: Beeler, J. R.
    role:
      role term: creator
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: ne
    place:
      place term: Amsterdam
    place:
      place term: New York
    place:
      place term: New York
    publisher: North-Holland Pub. Co.
    publisher: Elsevier Science Pub. Co. [distributor]
    date issued: 1983
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: access
    form: remote
    extent: 1 online resource (xviii, 881 pages) : illustrations
  abstract: Radiation Effects Computer Experiments.
  table of contents: Front Cover; Radiation Effects Computer Experiments; Copyright Page; Preface; Table of Contents; Chapter 1. Introduction; 1.1 The computer experiment concept; 1.2 Defect production computer experiments; 1.3 Defect annealing computer experiments; 1.4 Defect property computer experiments; 1.5 Defect interaction computer experiments; 1.6 Nature of the book; 1.7 Plan of the book; Appendix A 1 Computer experiment utility; References; Chapter 2. Computer experiment methods; 2.1 Introduction; 2.2 Dynamical method; 2.3 Monte Carlo method; 2.4 Variational method; References (ch. 2)
  table of contents: Appendix A2.1 Computational cell constructionAppendix A2.2 Periodic boundary conditions; Appendix A2.3 Elastic continuum boundary conditions; Appendix A2.4 Thermal crystal initial conditions; Appendix A2.5 Dynamical method integration schemes; Appendix A2.6 Time step change in a dynamical method program; Appendix A2.7 Force calculations; Appendix A2.8 Atom velocity damping at the computational cell boundary; Appendix A2.9 Firsov inelastic collision model for dynamical method programs; Appendix A2.10 Statistical sampling; Appendix A2.11 Multiply occupied atom sites; References (appendix A2)
  table of contents: Chapter 3. Outline of defect properties computations3.1 Introduction; 3.2 Defect energies; 3.3 Configuration energy computation procedure; 3.4 Migration energy computation procedure; 3.5 Entropy calculations; 3.6 Metal models used in defect property example calculations; 3.7 Neighbor shells in bcc, fee and hep crystals; Appendix A3.1 bcc computational cell site maps; Appendix A3.2 fee computational cell site maps; Appendix A3.3 hep computational cell site maps; References; Chapter 4. Vacancies and divacancies; 4.1 Introduction; 4.2 Configuration and binding energies
  table of contents: 4.3 Vacancy GE1% displacement field4.4 Divacancy GE1% displacement field; References; Chapter 5. Self interstitials; 5.1 Introduction; 5.2 Self interstitials in bcc iron(m); 5.3 Self interstitials in a fee metal; 5.4 Self interstitials in the hep metal(m); References; Chapter 6. Impurity atoms; 6.1 Introduction; 6.2 Substitutional metallic large impurity atom (LIA); 6.3 Substitutional metallic small impurity atom (SIA); 6.4 Helium; 6.5 Carbon; 6.6 Carbon(m)-vacancy and carbon(m)-interstitial complexes; 6.7 Helium complexes; References; Chapter 7. Defect migration; 7.1 Introduction
  table of contents: 7.2 Vacancy migration7.3 Divacancy migration; 7.4 Self-interstitial migration; 7.5 Carbon(m) migration; 7.6 Helium(m) Migration; 7.7 Dynamical method simulation of defect migration; References; Chapter 8. Vacancy clusters; 8.1 Introduction; 8.2 Vacancy clusters in bcc iron(m); 8.3 Vacancy clusters in fee metals; 8.4 Vacancy clusters in the hep metal(m); 8.5 Heterogeneous nucleation of vacancy clusters and voids; References; Chapter 9. Interstitial clusters; 9.1 Introduction; 9.2 Interstitial clusters in fee iron(m); 9.3 Interstitial loops in fee iron(m)
  note: J.R. Beeler, Jr.
  note: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
  note: digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
  note: Includes bibliographical references and index.
  note: English.
  subject:
    topic: Materials
    topic: Effect of radiation on
    topic: Data processing
  subject:
    topic: Matériaux
    topic: Effets du rayonnement sur
    topic: Informatique
  subject:
    topic: Materials
    topic: Effect of radiation on
    topic: Data processing
  subject:
    topic: Teoria da computacao (engenharia eletrica)
  subject:
    topic: Solids
    topic: Defects
    topic: Production by radiation
    topic: Simulations
    topic: Applications of computer systems
  classification: TA418.6 .B43 1983
  classification: 620.1/1228
  related item:
    title info:
      title: Radiation effects, computer experiments
    name:
      name part: Beeler, J.R.
    origin info:
      publisher: Amsterdam ; New York : North-Holland Pub. Co. ; New York : Elsevier Science Pub. Co. [distributor], 1983
    identifier: (DLC) 83168763
    identifier: (OCoLC)9744754
  related item:
    identifier: (DLC) 83168763
    identifier: (OCoLC)9744754
  related item:
    title info:
      title: Defects in solids ; v. 13
  identifier: 0080984649
  identifier: 9780080984643
  identifier: 044486315X
  identifier: 9780444863157
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OCLCE
    record creation date: 100429
    record change date: 20260326174525.4
    record identifier: in00005742429
    language of cataloging:
      language term: eng