Size effects in thin films /

A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical v...

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Bibliographic Details
Main Author: Tellier, C. R. (Colette R.), 1947-
Corporate Author: ScienceDirect (Online service)
Other Authors: Tosser, A. J. (André J.), 1940-
Format: eBook
Language:English
Published: Amsterdam ; New York : Elsevier, 1982.
Series:Thin films science and technology ; 2.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.
Physical Description:1 online resource (ix, 310 pages) : illustrations
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and indexes.
ISBN:9781483289762
1483289761