http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
1 online resource (xi, 493 pages) : illustrations
Submicron structure and microanalysis / K.N. Tu and R. Rosenberg -- Synchrotron radiation photoemission studies of interfaces / J.H. Weaver -- Contact x-ray microscopy / R. Feder and D.M. Shinozaki -- X-ray diffraction analysis of stress and strain in thin films / A. Segmuller and M. Murakami --X-ray diffraction analysis of diffusion in thin films / M. Murakami, A. Segmuller, and K.N. Tu -- ESCA / N. Martensson -- Cross-sectional transmission electron microscopy of electronic and photonic devices / T.T. Sheng -- High resolution transmission electron microscopy of surfaces and interfaces / D. Cherns -- Scanning transmission electron microscopy / P. Batson -- Rutherford backscattering spectrometry on thin solid films / T.G. Finstad and W.K. Chu -- Atomic structure and atomic layer compositional analysis of thin solid films using time-of-flight atom-probe field ion microscopy / T.T. Tsong.
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
Includes bibliographical references and index.
Treatise on materials science and technology ; v. 27