Table of Contents:
  • Vol. 1. Introduction to analytical methods / J. H. Richardson and R. V. Peterson
  • Alpha-particle spectrometry / J. H. Patterson
  • Auger electron spectrometry / Gary Stupian
  • Electron diffraction: high energy (HEED) / Raymcmd K. Hart
  • Electron diffraction: low energy (LEED) / Helen H. Farrell
  • Electron microprohe / John R. Ogren
  • Electron paramagnetic resonance spectrometry / Juan A. McMillan
  • Fluorometry / John L. Kropp
  • Infrared spectrometry / A. Lee Smith
  • Liquid chromatography / R. E. Leitch.
  • Vol. 2. Microwave spectrometry / Robert L. Cook and Gordon E. Jones
  • Neutron activation analysis / H. R. Lukens, H. L. Schlesinger, and D. Bryan
  • Nuclear magnetic resonance spectrometry / Don Ware and R. S. Codrington
  • Uaman spectrometry / J.E. Katon
  • Refractometry / J. H. Richardson
  • Scanning electron microscopy / John C. Russ
  • Ultraviolet photoclectron spectrometry / John J. Uebbing
  • Visible and ultraviolet absorption spectrometry / Richard S. Danchik
  • X-Ray photoelectron spectrometry (ESCA) / Warren G. Proctor.
  • Vol. 3. Computer-instrument interfacing / Charles L. Wilkins and Charles E. Klopfenstein
  • Emission spectrometry: arc, spark, laser, and plasmas / Ramon M. Barnes
  • Flame photometry / Juan Ramirez-Munoz
  • Gas analysis techniques and combustion methods / R. V. Peterson
  • Gas chromatography / Gerald R. Shoemake
  • Ion-scattering spectrometry for surface analysis / Robert S. Carbonara
  • Mossbauer spectrometry / P.A. Pella
  • Optical microscopy / J. H. Richardson
  • X-Ray diffraction / G. M. Wolten
  • X-Ray fluorescence and absorption spectrometry / N. Spielberg.
  • Vol. 4. Atomic-absorption and atomic-fluorescence flame photometry / Juan Ramirez-Munoz
  • Ion microprobe / T. A. Whatley and E. Davidson
  • Mass spectrometry / Ronald F. Skinner and Elaine Heron
  • Molecular weight determinations / R. V. Peterson
  • Neutron diffractometry / Melvin H. Mueller
  • Particulate characterization / Shepard Kinsman
  • Polarimetry / J. H. Richardson
  • Polarography and related methods / Petr Zuman
  • Methods for the detection of noncentrosymmetry in solids / S. K. Kurtz and J.P. Dougherty
  • Dynamic thermal analysis / E. M. Barrall, II, and R. J. Gritter
  • Transmission electron microscopy / James C. Williams and Neil Paton.