rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Volume 109
  name:
    name part: Hawkes, P. W.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: cau
    place:
      place term: San Diego
    publisher: Academic Press
    date issued: ©1999
    date issued: 1999
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xvi, 453 pages) : illustrations
  abstract: Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  table of contents: Front Cover; Advances in Imaging and Electron Physics, Volume 109; Copyright Page; Contents; Contributors; Preface; Forthcoming Contributors; Chapter 1. Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques; I. Introduction; II. Review of the Deep-Level Transient Spectroscopy Method; III. Averaging and Recording of Digital DLTS Transient Signals; IV. Feedback Circuits and Experimental Setup for CC-DLTS and CR-DLTS; V. Constant-Resistance DLTS in Enhancement Mode MOSFETs; VI. Constant-Resistance DLTS in Depletion Mode MOSFETs
  table of contents: VII. Constant-Resistance DLTS in Junction Field-Effect TransistorsVIII. Conclusions and Areas for Future Research; References; Appendix A: Magnitude Errors; Appendix B: Time Constant Errors; Appendix C: Noise Sources and Signal-to-Noise Ratio (SNR) in the DLTS Transients; Appendix D: Electrical Circuit of the Pseudo-Logarithmic Generator; Appendix E: Electrical Circuits of the Feedback Circuit; Appendix F: Listing of a Template for a DLTS Measurement Program; Appendix G: Listing of a Template for a DLTS Analysis Program; Appendix H: Radiation-Induced Defects in Silicon; List of Acronyms
  table of contents: List of SymbolsChapter 2. Complex Dyadic Multiresolution Analyses; I. Introduction; II. The Spline Example; III. Multiresolution and Wavelet; IV. Daubechies' Wavelets; V. Symmetric Daubechies Wavelets; VI. The Phase of SDW Scaling Function; VII. The Mallat Algorithm with Complex Filters; VIII. Restoration from the Phase; IX. lmage Enhancement; X. Complex Shrinkage; XI. Conclusion; References; Reading List; Chapter 3. Lattice Vector Quantization for Wavelet-Based Image Coding; I. Introduction; II. Quantization of Wavelet Coefficients; III. Lattice Quantization Fundamentals; IV. Lattices
  table of contents: v. Quantization Algorithms for Selected LatticesVI. Counting the Lattice Points; VII. Scaling Algorithm; VIII. Selecting a Lattice for Quantization; IX. Entropy Coding of Lattice Vectors; X. Experimental Results; XI. Conclusions; Appendix A: Cartan Matrices of Some Root Systems; References; Chapter 4. Fuzzy Cellular Neural Networks and Their Applications to Image Processing; I. Introduction; II. Fuzzy Cellular Neural Networks; III. Theory of Fuzzy Cellular Neural Networks; IV. FCNN as Computational Arrays; V. Embed Linguistic Statements into FCNN; VI. Learning Algorithms of FCNN
  table of contents: VII. Generic Algorithm for FCNNVIII. Applications of Discrete-Time FCNN; IX. Conclusions and Future Work; References; Index
  note: edited by Peter Hawkes.
  note: Includes bibliographical references and index.
  note: English.
  subject:
    topic: Electrons
  subject:
    topic: Electron microscopes
  subject:
    topic: Image processing
  subject:
    topic: Electronics
  subject:
    topic: Électrons
  subject:
    topic: Microscopes électroniques
  subject:
    topic: Traitement d'images
  subject:
    topic: Électronique
  subject:
    topic: image processing
  subject:
    topic: electronic engineering
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electromagnetism
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electricity
  subject:
    topic: Electron microscopes
  subject:
    topic: Electronics
  subject:
    topic: Electrons
  subject:
    topic: Image processing
  classification: QC793.5.E62 A37eb vol. 109
  classification: 537.5
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume 109
    origin info:
      publisher: San Diego : Academic Press, ©1999
    identifier: (OCoLC)42214780
  related item:
    title info:
      title: Advances in imaging and electron physics ; v. 109
  identifier: 9780080577753
  identifier: 008057775X
  identifier: 0120147513
  identifier: 9780120147519
  identifier: 1281719048
  identifier: 9781281719041
  identifier: 9786611719043
  identifier: 6611719040
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 090124
    record change date: 20260326160333.5
    record identifier: in00005736085
    language of cataloging:
      language term: eng