rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Volume 105
  name:
    name part: Hawkes, P. W.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: cau
    place:
      place term: San Diego
    place:
      place term: London
    publisher: Academic Press
    date issued: ©1999
    date issued: 1999
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xiii, 416 pages) : illustrations
  abstract: Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  table of contents: Front Cover; Advances in Imaging and Electron Physics, Volume 105; Copyright Page; Contents; Contributors; Preface; Chapter 1. Near-Sensor Image Processing; I. Introduction; II. A Near-Sensor Image Processor; III. Near-Sensor Image Processing Algorithms; IV. Adaptive Thresholding; V. Variable Sampling Time; VI. Grayscale Morphology; VII. Linear Convolution; VIII. A 2D NSIP Model; IX. Global Operations; X. Feature Extraction; XI. An NSIP System; XII. Sheet-of-Light Range Images; XIII. Conclusion; Acknowledgment; References.
  table of contents: Chapter 2. Digital Image Processing Technology for Scanning Electron MicroscopyI. Introduction; II. Proper Acquisition and Handling of SEM Image; III. Quality Improvement of SEM Images; IV. Image Measurement and Analysis; V. SEM Parameters Measurement; VI. Color SEM Image; VII. Automatic Focusing and Astigmatism Correction; VIII. Remote Control of SEM; IX. Active Image Processing; References; Chapter 3. Design and Performance of Shadow-Mask Color Cathode Ray Tubes; I. Introduction; II. Basic Structure of Shadow-Mask Tube and Principle of Operation; III. Alternative Gun and Screen Arrangements.
  table of contents: IV. Geometric ConsiderationsV. Shadow Masks; VI. Phosphor Materials and Screen Fabrication; VII. Deflection; VIII. Glass Bulbs; IX. Reduction of Screen Curvature and Use of Flat Tension Masks; X. Contrast Enhancement; XI. Moire; XII. Shadow-Mask Tubes for High-Resolution Display Applications; XIII. Human Factors and Health Considerations; XIV. Concluding Remarks; Acknowledgment; Appendix: Some Specifications of Representative Tube Types; References; Chapter 4. Electron Gun Systems for Color Cathode Ray Tubes; I. Historical Introduction.
  table of contents: II. Electron Beam Formation and Factors Limiting Current Density of SpotIII. Electron Gun Designs; IV. Cathodes; V. Techniques for Improving High-Tension Stability; Acknowledgment; References; Index.
  note: edited by Peter W. Hawkes.
  note: Includes bibliographical references and index.
  note: English.
  subject:
    topic: Electrons
  subject:
    topic: Electron microscopes
  subject:
    topic: Image processing
  subject:
    topic: Electronics
  subject:
    topic: Electrons
  subject:
    topic: Electronics
  subject:
    topic: Électrons
  subject:
    topic: Microscopes électroniques
  subject:
    topic: Traitement d'images
  subject:
    topic: Électronique
  subject:
    topic: image processing
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electromagnetism
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electricity
  subject:
    topic: Electron microscopes
  subject:
    topic: Electronics
  subject:
    topic: Electrons
  subject:
    topic: Image processing
  classification: QC793.5.E62 A37eb vol. 105
  classification: 537.5
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume 105
    origin info:
      publisher: San Diego ; London : Academic Press, ©1999
    identifier: (OCoLC)40756705
  related item:
    title info:
      title: Advances in imaging and electron physics
  identifier: 9780080577715
  identifier: 0080577717
  identifier: 0120147475
  identifier: 9780120147472
  identifier: 1281719005
  identifier: 9781281719003
  identifier: 9786611719005
  identifier: 6611719008
  identifier: 11E7E852-28D4-421F-9736-1E01EC0253AF OverDrive, Inc.
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 090124
    record change date: 20260326160331.2
    record identifier: in00005736054
    language of cataloging:
      language term: eng