rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Volume 150
  name:
    name part: Hawkes, Peter W.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: ne
    place:
      place term: Amsterdam
    place:
      place term: Boston
    publisher: Elsevier/Academic Press
    date issued: ©2008
    date issued: 2008
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (1 volume)
  abstract: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as "Academic Press, 1994" (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, 'Computer Techniques for Image Processing in Electron Microscopy', Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing. * Updated with contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians
  table of contents: *I. Daubechies, G. Tesche and L. Vese, On some iterative concepts for image restoration; *R.F.W. Pease, Significant advances in scanning electron microscopy; 1965-2007; *J. M. Rodenburg, Ptychography and related diffractive imaging methods; *J. Serra, Advances in mathematical morphology: segmentation
  note: edited by Peter W. Hawkes.
  note: Includes bibliographical references and index.
  note: English.
  subject:
    topic: Optoelectronic devices
  subject:
    topic: Optical data processing
  subject:
    topic: Image processing
  subject:
    topic: Dispositifs optoélectroniques
  subject:
    topic: Traitement optique de l'information
  subject:
    topic: Traitement d'images
  subject:
    topic: image processing
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Imaging Systems
  subject:
    topic: Optical data processing
  subject:
    topic: Optoelectronic devices
  classification: QC793.5.E62 A38eb vol. 150
  classification: 621.367
  related item:
    title info:
      title: Advances in imaging and electron physics ; 150
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume 150
    origin info:
      publisher: Amsterdam ; Boston : Elsevier/Academic Press, ©2008
    identifier: (OCoLC)191752286
  identifier: 9780080569123
  identifier: 0080569129
  identifier: 9780123742179
  identifier: 012374217X
  identifier: 1281272884
  identifier: 9781281272881
  identifier: 9786611272883
  identifier: 6611272887
  identifier: 9780080569123 Ingram Content Group
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 080808
    record change date: 20260326155119.8
    record identifier: in00005734713
    language of cataloging:
      language term: eng