rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Surfaces and their measurement
  name:
    name part: Whitehouse, D. J. (David J.)
    role:
      role term: creator
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  genre: dissertations.
  genre: Academic theses
  genre: Academic theses.
  genre: Thèses et écrits académiques.
  origin info:
    place:
      place term: enk
    place:
      place term: London
    publisher: HPS
    date issued: 2002
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xi, 395 pages) : illustrations
  abstract: The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. Written by one of the world's leading metrologists Covers electronics and optics applications as well as mechanical Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia.
  table of contents: Identification and separation of surface features -- Profile and areal (3D) parameter characterization -- Surface metrology and manufacture -- Function and surface texture -- Surface finish measurement : general -- Stylus instruments -- Optical methods -- Scanning microscopes -- Errors of form (excluding axes of rotation) -- Roundness and related subjects -- Cylindricity, sphericity -- Metrology instrument design and operation for minimum error -- Calibration of instruments -- Sampling, numerical analysis, display.
  note: David Whitehouse.
  note: Includes bibliographical references and index.
  note: English.
  subject:
    topic: Surfaces (Technology)
    topic: Measurement
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Nanotechnology & MEMS
  subject:
    topic: Surfaces (Technology)
    topic: Measurement
  classification: TA418.7 .W473 2002eb
  classification: 620.44
  classification: PJ 62
  related item:
    title info:
      title: Surfaces and their measurement
    name:
      name part: Whitehouse, D.J. (David J.).
    origin info:
      publisher: London : HPS, 2002
    identifier: (OCoLC)47355702
  identifier: 9781903996010
  identifier: 1903996015
  identifier: 1417526688
  identifier: 9781417526680
  identifier: 1281073075
  identifier: 9781281073075
  identifier: 9786611073077
  identifier: 6611073078
  identifier: 0080518230
  identifier: 9780080518237
  identifier: 115594:115690 Elsevier Science & Technology
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OPELS
    record creation date: 070802
    record change date: 20260326150222.0
    record identifier: in00005731425
    language of cataloging:
      language term: eng