http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Advances in imaging and electron physics
1 online resource (xv, 333 pages) : illustrations.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement; The S-State Model for Electron Channeling in High-Resolution Electron Microscopy; Measurement of Electric Fields on Object Surface in an Emission Electron Microscope; Index.
Includes bibliographical references and index.
Advances in imaging and electron physics. Volume 136
Amsterdam ; Boston : Elsevier Academic Press, ©2005
Advances in imaging and electron physics ; 136
E83F57BE-9D71-4A05-BC33-33EFBED0D1F2 OverDrive, Inc.