rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Volume 136
  name:
    name part: Hawkes, P. W.
    role:
      role term: edt
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: ne
    place:
      place term: Amsterdam
    place:
      place term: Boston
    publisher: Elsevier Academic Press
    date issued: ©2005
    date issued: 2005
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xv, 333 pages) : illustrations.
  abstract: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  table of contents: Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement; The S-State Model for Electron Channeling in High-Resolution Electron Microscopy; Measurement of Electric Fields on Object Surface in an Emission Electron Microscope; Index.
  note: edited by Peter W. Hawkes.
  note: Includes bibliographical references and index.
  subject:
    topic: Image processing
  subject:
    topic: Electron microscopy
  subject:
    topic: Traitement d'images
  subject:
    topic: Microscopie électronique
  subject:
    topic: image processing
  subject:
    topic: electron microscopy
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electromagnetism
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electricity
  subject:
    topic: Electron microscopy
  subject:
    topic: Image processing
  classification: QC793.5.E62 A38eb vol. 136
  classification: 537.5/6
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume 136
    origin info:
      publisher: Amsterdam ; Boston : Elsevier Academic Press, ©2005
    identifier: (OCoLC)63785097
  related item:
    title info:
      title: Advances in imaging and electron physics ; 136
  identifier: 0080458556
  identifier: 9780080458557
  identifier: 0120147785
  identifier: 9780120147786
  identifier: E83F57BE-9D71-4A05-BC33-33EFBED0D1F2 OverDrive, Inc.
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 061120
    record change date: 20260326145026.3
    record identifier: in00005730305
    language of cataloging:
      language term: eng