rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Volume 142
  name:
    name part: Hawkes, P. W.
  name:
    name part: Kazan, Benjamin.
  name:
    name part: Mulvey, Thomas.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: cau
    place:
      place term: San Diego
    publisher: Academic Press
    date issued: ©2006
    date issued: 2006
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xiv, 336 pages) : illustrations.
  abstract: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  table of contents: Contributors; Preface; Future Contributions; Conservative Optical Logic Devices: COLD; Introduction; A Short Overview of Conservative Logic; Logics for Optics; Interferometers for Special Conservative Optical Logic Operations; Toward an All-Passive NOR Gate; The Mach-Zehnder Interferometer as an Optically Controllable Digital Light Deflector; Multiple COLD Chips; Advantages Achieved by COLD; Conclusions; Appendix A; References; Advanced Neutron Imaging and Sensing; Introduction; Neutron Optics: Experimental Interferometry; Neutron Optics: Basic Concepts.
  note: edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey].
  note: Includes bibliographical references and index.
  subject:
    topic: Electrons
  subject:
    topic: Electron microscopes
  subject:
    topic: Microscopy
  subject:
    topic: Image processing
  subject:
    topic: Electrons
  subject:
    topic: Microscopy
  subject:
    topic: Électrons
  subject:
    topic: Microscopes électroniques
  subject:
    topic: Microscopie
  subject:
    topic: Traitement d'images
  subject:
    topic: microscopy
  subject:
    topic: image processing
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electromagnetism
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electricity
  subject:
    topic: Electron microscopes
  subject:
    topic: Electrons
  subject:
    topic: Image processing
  subject:
    topic: Microscopy
  classification: QC793.5.E62 A38eb vol. 142
  classification: 537.5/6
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume 142
    origin info:
      publisher: San Diego : Academic Press, ©2006
    identifier: (OCoLC)71063026
  related item:
    title info:
      title: Advances in imaging and electron physics ; v. 142
  identifier: 0080462839
  identifier: 9780080462837
  identifier: 012014784X
  identifier: 9780120147847
  identifier: 132728:132849 Elsevier Science & Technology
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 061221
    record change date: 20260326145021.8
    record identifier: in00005730261
    language of cataloging:
      language term: eng