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Atomic force microscopy /

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Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Bibliographic Details
Main Authors: Eaton, Peter Jonathan (Author), West, Paul (Author)
Corporate Author: Oxford University Press
Format: eBook
Language:English
Language Notes:English.
Published: Oxford : Oxford University Press, 2010.
Subjects:
Atomic force microscopy.
Microscopie à force atomique.
SCIENCE > Microscopes & Microscopy.
Atomic force microscopy
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Introduction
  • AFM instrumentation
  • AFM modes
  • Measuring AFM images
  • AFM image processing and analysis
  • AFM image artefacts
  • Applications of AFM.