http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
1 online resource (viii, 248 pages) : illustrations
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Introduction -- AFM instrumentation -- AFM modes -- Measuring AFM images -- AFM image processing and analysis -- AFM image artefacts -- Applications of AFM.
Includes bibliographical references and index.
Oxford ; New York : Oxford University Press, 2010