In-situ electron microscopy : applications in physics, chemistry and materials science /

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples...

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Bibliographic Details
Other Authors: Dehm, Gerhard, Howe, James M., 1955-, Zweck, Josef
Format: eBook
Language:English
Language Notes:English.
Published: Weinheim : Chichester : WileyVCH ; John Wiley [distributor], 2012.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
Physical Description:1 online resource (xviii, 383 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:9783527652167
3527652167
9783527652198
3527652191
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9783527652181
3527652175
9783527652174
9781299157064
1299157068