X-ray diffraction by polycrystalline materials /
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. Part One is a historical presentation of the discovery of X-ray diffraction. Part Two is devoted to a description of the physical phenomenon of X-ray diffraction on perfect and imperfect c...
| Main Author: | |
|---|---|
| Format: | eBook |
| Language: | English |
| Language Notes: | English. |
| Published: |
London ; Newport Beach, CA :
ISTE,
2007.
|
| Series: | ISTE.
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | This book presents a physical approach to the diffraction phenomenon and its applications in materials science. Part One is a historical presentation of the discovery of X-ray diffraction. Part Two is devoted to a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. A detailed analysis of the instruments used for the characterization of powdered materials or thin films is proposed in part three. The description of the processing of measured signals and their results is given. In the final part, the author presents recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. |
|---|---|
| Physical Description: | 1 online resource (xxxii, 351 pages) : illustrations |
| Bibliography: | Includes bibliographical references (pages 319-347) and index. |
| ISBN: | 9780470612408 0470612401 9781847045713 1847045715 9780470394533 0470394536 1280847646 9781280847646 9786610847648 6610847649 |