Tribology in chemical-mechanical planarization /

The role that friction and contact play in the processes of wear and planarization on material surfaces is central to the understanding of Chemical-Mechanical planarization (CMP) technology, particularly when applied to nanosurfaces. Tribology in Chemical-Mechanical Planarization presents a detailed...

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Bibliographic Details
Main Author: Liang, Hong, 1961 (Author)
Corporate Author: Taylor & Francis
Other Authors: Craven, David R., 1945-
Format: eBook
Language:English
Language Notes:English.
Published: Boca Raton, Fla. : Taylor & Francis, 2005.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:The role that friction and contact play in the processes of wear and planarization on material surfaces is central to the understanding of Chemical-Mechanical planarization (CMP) technology, particularly when applied to nanosurfaces. Tribology in Chemical-Mechanical Planarization presents a detailed account of the CMP process in a language that is suitable for tribology professionals as well as chemists, materials scientists, physicists, and other applied scientists and engineers in fields of semiconductors and microelectronics. The first half of the book is devoted to CMP, while the other f.
Item Description:Description based upon print version of record.
Physical Description:1 online resource (198 p.)
Bibliography:Includes bibliographical references and index.
ISBN:0429120087
9780429120084
9786610516780
6610516782
1420028391
9781420028393