Model-based testing for embedded systems /

What the experts have to say about Model-Based Testing for Embedded Systems:""This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic wi...

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Bibliographic Details
Corporate Author: Taylor & Francis
Other Authors: Zander, Justyna, Schieferdecker, Ina, Mosterman, Pieter J.
Format: eBook
Language:English
Language Notes:English.
Published: Boca Raton, Fla. : CRC Press, 2012.
Edition:1st edition.
Series:Computational analysis, synthesis, and design of dynamic models series.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:What the experts have to say about Model-Based Testing for Embedded Systems:""This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading ex.
Item Description:Description based upon print version of record.
Physical Description:1 online resource (668 p.).
Bibliography:Includes bibliographical references.
ISBN:9786613525574
661352557X
9781351833912
135183391X
9781315218021
131521802X
9781280121715
1280121718
9781439818473
1439818479