Noise Coupling in System-on-Chip.

"Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating...

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Bibliographic Details
Corporate Author: Taylor & Francis
Other Authors: Noulis, Thomas (Editor)
Format: eBook
Language:English
Published: Boca Raton, FL : CRC Press, 2017.
Edition:First edition.
Series:Devices, Circuits, and Systems
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:"Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends."--Provided by publisher.
Physical Description:1 online resource : text file, PDF
ISBN:9781315116693
1315116693
9781138031616
1138031615