rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Proceedings of the ... IEEE VLSI Test Symposium
    sub title: VTS
  title info:
    title: Proc. IEEE VLSI Test Symp
    sub title: (Online)
  title info:
    title: IEEE VLSI Test Symposium
  title info:
    title: IEEE Very Large Scale Integration Test Symposium
  title info:
    title: VLSI Test Symposium
  title info:
    title: Very Large Scale Integration Test Symposium
  title info:
    title: VTS
  title info:
    title: Proceedings ... IEEE ... VLSI Test Symposium
  name:
    name part: IEEE VLSI Test Symposium.
    role:
      role term: creator
  name:
    name part: IEEE Computer Society
    name part: Test Technology Technical Committee.
  name:
    name part: Institute of Electrical and Electronics Engineers
    name part: Philadelphia Section.
  type of resource: text
  genre: conference publication
  genre: Electronic journals.
  genre: Conference papers and proceedings.
  origin info:
    place:
      place term: cau
    place:
      place term: Los Alamitos, Calif.]
    publisher: [IEEE Computer Society Press]
    date issued: 1994
    date issued: 9999
    issuance: continuing
    frequency: Annual
  language:
    language term: eng
  physical description:
    form: remote
  note: Also issued in print.
  note: Mode of access: World Wide Web.
  note: Print version sponsored by the IEEE Computer Society Technical Committee on Test Technology [and] IEEE Philadelphia Section.
  note: Original print version of this title was preceded by an earlier title called: IEEE VLSI Test Symposium. Digest of papers.
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Testing
    genre: Congresses
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Testing
  classification: TK7874
  classification: 621
  related item:
    title info:
      title: Proceedings
    name:
      name part: IEEE VLSI Test Symposium.
    identifier: 1093-0167
    identifier: (DLC) 98659011
    identifier: (OCoLC)32735362
  related item:
    title info:
      title: Digest of papers
    name:
      name part: IEEE VLSI Test Symposium.
  identifier: 1093-0167
  identifier: 2375-1053
  identifier: 2005262240
  record info:
    record content source: CGU
    record creation date: 051102
    record change date: 20260205155436.4
    record identifier: in00005679001
    language of cataloging:
      language term: eng