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Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 : Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics /

Advancements in Optical Methods, Digital Image Correlation and Micro-and Nanomechanics, Volume 4 of the Proceedings of the 2022 SEM Annual Conference and Exposition on Experimental and Applied Mechanics, the fourth volume of six from the Conference, brings together contributions to this important ar...

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Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Lin, Ming-Tzer (Editor, http://id), Furlong, Cosme (Editor, http://id), Hwang, Chi-Hung (Editor, http://id), Naraghi, Mohammad (Editor, http://id), DelRio, Frank (Editor, http://id)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2023.
Edition:1st ed. 2023.
Series:Conference proceedings of the Society for Experimental Mechanics series.
Subjects:
Materials > Analysis.
Signal processing.
Mechanics, Applied.
Nanotechnology.
Materials Characterization Technique.
Signal, Speech and Image Processing.
Engineering Mechanics.
Nanometrology.
Traitement du signal.
Mécanique appliquée.
Nanotechnologie.
Materials > Analysis
Mechanics, Applied
Nanotechnology
Signal processing
Electronic books.
Conference papers and proceedings
Online Access:Connect to the full text of this electronic book
Description
Summary:Advancements in Optical Methods, Digital Image Correlation and Micro-and Nanomechanics, Volume 4 of the Proceedings of the 2022 SEM Annual Conference and Exposition on Experimental and Applied Mechanics, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas: DIC Methods and Its Applications Photoelsticity and Interferometry Applications Micro-Optics and Microscopic Systems Multiscale and New Developments in Optical Methods Extreme Nanomechanics In-Situ Nanomechanics Expanding Boundaries in Metrology Micro and Nanoscale Deformation MEMS for Actuation, Sensing and Characterization 1D and 2D Materials.
Physical Description:1 online resource (VII, 81 pages 79 illustrations, 65 illustrations in color. :) online resource.
Bibliography:Includes bibliographical references.
ISBN:9783031174711
3031174712
3031174704
9783031174704
8743804047
9788743804048
ISSN:2191-5652