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High-Power Electromagnetic Effects on Electronic Systems /

Bibliographic Details
Main Authors: Giri, D. V. (Author), Hoad, Richard (Author), Sabath, Frank (Author)
Corporate Author: Knovel (Firm)
Format: eBook
Language:English
Published: Norwood, Massachusetts Artech House [2020]
Subjects:
Electromagnetic compatibility.
Compatibilité électromagnétique.
Electromagnetic compatibility
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:5.3.10 Published Device and Circuit-Level Effects Data.
Physical Description:1 online resource (1 PDF.)
Bibliography:Includes bibliographical references and index.
References -- 4 Overview of HPEM Test Facilities and Techniques -- 4.1 Introduction -- 4.1.1 General Considerations for the Scenario -- 4.1.2 General Considerations for HPEM Environment Simulation -- 4.1.3 General Considerations of the SUT -- 4.1.4 Summary -- 4.2 Uncertainty in Effects Testing -- 4.3 HPEM Effects Test Methods and Facilities -- 4.3.1 HPEM-Radiated Testing -- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation -- 4.3.3 Measuring the Radiated HPEM Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM Conducted Testing.
ISBN:9781630815899
1630815896