rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: VLSI and Post-CMOS Electronics
    sub title: Devices, circuits and interconnects
    part number: Volume 2
  name:
    name part: Dhiman, Rohit
    role:
      role term: editor.
  name:
    name part: Chandel, Rajeevan
    role:
      role term: editor.
  name:
    name part: Knovel (Firm)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2019
    copyright date: 2019
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (387 pages)
  abstract: The following topics are dealt with: integrated circuit design; VLSI; technology CAD (electronics); MOSFET; III-V semiconductors; silicon; semiconductor device models; SRAM chips; three-dimensional integrated circuits; permittivity.
  target audience: specialized
  note: edited by Rohit Dhiman; Rajeevan Chandel.
  note: Includes bibliographical references and index.
  subject:
    topic: Dielectric measurements
  subject:
    topic: Dielectrics
  subject:
    topic: Electric resistance
  subject:
    topic: Electronic apparatus and appliances
  subject:
    topic: Integrated circuits
  subject:
    topic: Integrated circuits
    topic: Computer-aided design
  subject:
    topic: Integrated circuits
    topic: Design and construction
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
  subject:
    topic: Metal oxide semiconductor field-effect transistors
  subject:
    topic: Semiconductors
  subject:
    topic: Silicon
  subject:
    topic: Mesures diélectriques
  subject:
    topic: Diélectriques
  subject:
    topic: Résistance électrique
  subject:
    topic: Circuits intégrés
  subject:
    topic: Circuits intégrés
    topic: Conception assistée par ordinateur
  subject:
    topic: Circuits intégrés
    topic: Conception et construction
  subject:
    topic: Circuits intégrés à très grande échelle
  subject:
    topic: Transistors MOSFET
  subject:
    topic: Semi-conducteurs
  subject:
    topic: Silicium
  subject:
    topic: resistivity
  subject:
    topic: semiconductor
  subject:
    topic: silicon
  subject:
    topic: Dielectric measurements
  subject:
    topic: Dielectrics
  subject:
    topic: Electric resistance
  subject:
    topic: Electronic apparatus and appliances
  subject:
    topic: Integrated circuits
  subject:
    topic: Integrated circuits
    topic: Computer-aided design
  subject:
    topic: Integrated circuits
    topic: Design and construction
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
  subject:
    topic: Metal oxide semiconductor field-effect transistors
  subject:
    topic: Semiconductors
  subject:
    topic: Silicon
  subject:
    topic: CMOS integrated circuits
  subject:
    topic: elemental semiconductors
  subject:
    topic: III-V semiconductors
  subject:
    topic: integrated circuit design
  subject:
    topic: MOSFET
  subject:
    topic: permittivity
  subject:
    topic: semiconductor device models
  subject:
    topic: silicon
  subject:
    topic: SRAM chips
  subject:
    topic: technology CAD (electronics)
  subject:
    topic: three-dimensional integrated circuits
  subject:
    topic: VLSI
  subject:
    topic: integrated circuit design
  subject:
    topic: VLSI
  subject:
    topic: technology CAD (electronics)
  subject:
    topic: MOSFET
  subject:
    topic: III-V semiconductors
  subject:
    topic: silicon
  subject:
    topic: semiconductor device models
  subject:
    topic: SRAM chips
  subject:
    topic: three-dimensional integrated circuits
  classification: QC589 .V575 2019
  classification: 537.2
  identifier: 9781839530548
  identifier: 1839530545
  identifier: 9781523127276
  identifier: 1523127279
  identifier: 9781839530531
  identifier: 1839530537
  identifier: http://proxy.library.tamu.edu/login

topic: permittivity

title info:
  title: Materials, circuits and devices series ; 73

record content source: STF
record creation date: 191018
record change date: 20260121210839.9
record identifier: in00005676262
language of cataloging:
  language term: eng