Cover Image

Very-Large-Scale Integration Physical Design : Engineering Change Order and Timing Design Rule Check.

This book presents an innovative approach to rectify Timing-Design Rule Check (TDRC) violations in Very-Large-Scale Integration (VLSI) chip design. Through the utilization of Tool Command Language (TCL) scripting, this automated solution streamlines the Engineering Change Order (ECO) process, offeri...

Full description

Bibliographic Details
Main Author:	Yeap, Kim Ho
Other Authors:	Tan, Ing Ming
Format:	eBook
Language:	English
Published:	Newcastle-upon-Tyne : Cambridge Scholars Publishing, 2025.
Subjects:	Integrated circuits > Very large scale integration.

Similar Items

Very large scale integration (VLSI) : fundamentals and applications /
Published: (1982)

Third Caltech Conference on Very Large Scale Integration : [papers] /
Published: (1983)

Ultra large scale integrated microelectronics /
by: Ferry, David K.
Published: (1988)

VLSI system design : when and how to design very-large-scale integrated circuits /
by: Muroga, Saburo
Published: (1982)

IEEE transactions on very large scale integration (VLSI) systems.
Published: (1993)

IEEE transactions on very large scale integration (VLSI) systems.
Published: (1993)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

Diagnostic measurements in LSI/VLSI integrated circuits production /
by: Jakubowski, Andrzej
Published: (1991)

VLSI test principles and architectures : design for testability /
Published: (2006)

LSI/VLSI testability design /
by: Tsui, Frank F.
Published: (1987)

Design & test techniques for VLSI & WSI circuits /
Published: (1989)

Design automation, languages, and simulations /
Published: (2003)

VLSI technology and design /
Published: (1987)

VLSI, technology and design /
Published: (1984)

Introduction to VLSI design flow /
by: Saurabh, Sneh
Published: (2023)

The design and analysis of VLSI circuits /
by: Glasser, Lance A.
Published: (1985)

VLSI-design of non-volatile memories /
by: Campardo, Giovanni
Published: (2005)

Yield simulation for integrated circuits /
by: Walker, Duncan Moore Henry
Published: (1987)

Rapid reliability assessment of VLSICs /
Published: (1990)

Digital MOS integrated circuits /
Published: (1981)

Genetic algorithms for VLSI design, layout & test automation /
by: Mazumder, Pinaki
Published: (1999)

Top-down digital VLSI design : from architectures to gate-level circuits and FPGAs /
by: Kaeslin, Hubert
Published: (2014)

VLSI 85 : VLSI design of digital systems : proceedings of the IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, Tokyo, Japan, 26-28 August 1985 /
Published: (1986)

VLSI 87 : VLSI design of digital systems : proceedings of the IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, Vancouver, Canada, 10-12 August 1987 /
Published: (1988)

VLSI '83 : VLSI design of digital systems : proceedings of the IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, Trondheim, Norway, 16-19 August 1983 /
Published: (1983)

VLSI 81 : Very large scale integration /
Published: (1981)

VLSI design.
Published: (1981)

VLSI design.

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Advanced model order reduction techniques in VLSI design /
by: Tan, Sheldon X. D.
Published: (2007)

Large scale integration /
Published: (1976)

VLSI systems design.
Published: (1985)

Research on integrated systems : proceedings of the 1993 symposium /
Published: (1993)

VLSI digital signal processing systems : design and implementation /
by: Parhi, Keshab K., 1959-
Published: (1999)

VLSI 91 : proceedings of the IFIP TC10/WG 10.5 International Conference on Very Large Scale Integration, Edinburgh, Scotland, 20-22 August 1991 /
Published: (1992)

From contamination to defects, faults, and yield loss : simulation and applications /
by: Khare, Jitendra B.
Published: (1996)

Design methodologies for VLSI circuits /
Published: (1982)

VLSI circuit design methodology demystified : a conceptual taxonomy /
by: Xiu, Liming
Published: (2007)

VLSI design : proceedings /
Published: (1992)

Minimizing and exploiting leakage in VLSI design /
Published: (2010)