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Defects of Solid Semiconductor Structures Special topic volume with invited peer-reviewed papers only

This special edition addresses one of the most critical aspects of semiconductor technology: the presence and impact of defects within solid semiconductor materials on the performance and reliability of electronic devices. The presented edition will be useful to researchers and engineers in the semi...

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Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Riccio, Michele (Editor), Irace, Andrea (Editor), Breglio, Giovanni (Editor)
Format: eBook
Language:English
Published: Switzerland : Trans Tech Publications Ltd, 2024.
Series:Defect and Diffusion Forum Vol. 434
Subjects:
Basal Plane Dislocation.
Bipolar Degradation.
Crystal Defects.
Defect Decomposition.
Defect Inspection.
Epilayer.
Post-Growth Thermal Treatment.
SiC MOSFET.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:This special edition addresses one of the most critical aspects of semiconductor technology: the presence and impact of defects within solid semiconductor materials on the performance and reliability of electronic devices. The presented edition will be useful to researchers and engineers in the semiconductor industry and will serve as an essential resource for those looking to deepen their understanding of the nature of defects in semiconductor structures and their influences on the efficiency and reliability of power electronic devices. SiC MOSFET, Basal Plane Dislocation, Epilayer, Bipolar Degradation, Defect Inspection, Post-Growth Thermal Treatment, Crystal Defects, Defect Decomposition Materials Science, Electronics, Nanoscience.
Physical Description:1 online resource.
Bibliography:Includes bibliographical references and index.
ISBN:9783036416359
3036416358
ISSN:1662-9507