rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Mathematical models for systems reliability
  name:
    name part: Epstein, Benjamin
    name part: 1918-
    role:
      role term: creator
  name:
    name part: Weissman, Ishay
    name part: 1940-
  name:
    name part: Taylor & Francis
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: flu
    place:
      place term: Boca Raton
    publisher: CRC Press
    date issued: ©2008
    date issued: 2008
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (253 pages) : illustrations
  abstract: Covers the required probability background for understanding reliability theory. This book shows how certain techniques can be applied to a range of reliability problems. It explores statistical estimation theory, measures of system effectiveness, general continuous-time Markov chains, and more.
  table of contents: Cover; Title; Copyright; Dedication; Preface; Contents; CHAPTER 1: Preliminaries; CHAPTER 2: Statistical life length distributions; CHAPTER 3: Reliability of various arrangements of units; CHAPTER 4: Reliability of a one-unit repairable system; CHAPTER 5: Reliability of a two-unit repairable system; CHAPTER 6: Continuous-time Markov chains; CHAPTER 7: First passage time for systems reliability; CHAPTER 8: Embedded Markov chains and systems reliability; CHAPTER 9: Integral equations in reliability theory; References; Index.
  note: Benjamin Epstein, Ishay Weissman.
  note: "A Chapman & Hall book."
  note: Includes bibliographical references (pages 247-250) and index.
  subject:
    topic: Reliability (Engineering)
    topic: Mathematics
  subject:
    topic: System failures (Engineering)
    topic: Mathematical models
  subject:
    topic: Engineering
  subject:
    topic: Mathematical models
  subject:
    topic: Reproducible research
  subject:
    topic: Engineering
  subject:
    topic: Models, Theoretical
  subject:
    topic: Reproducibility of Results
  subject:
    topic: Fiabilité
    topic: Mathématiques
  subject:
    topic: Pannes
    topic: Modèles mathématiques
  subject:
    topic: Ingénierie
  subject:
    topic: Modèles mathématiques
  subject:
    topic: Reproductibilité (Sciences)
  subject:
    topic: engineering
  subject:
    topic: mathematical models
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Quality Control
  subject:
    topic: Mathematical models
  subject:
    topic: Engineering
  subject:
    topic: Reliability (Engineering)
    topic: Mathematics
  subject:
    topic: System failures (Engineering)
    topic: Mathematical models
  classification: TA169 .E67 2008eb
  classification: 620/.00452015118
  classification: TA 169
  related item:
    title info:
      title: Mathematical models for systems reliability
    name:
      name part: Epstein, Benjamin, 1918-
    origin info:
      publisher: Boca Raton : CRC Press, ©2008
    identifier: (DLC) 2008010874
    identifier: (OCoLC)213375865
  identifier: 9781420080834
  identifier: 1420080830
  identifier: 9781420080827
  identifier: 1420080822
  identifier: 1281771481
  identifier: 9781281771483
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 080930
    record change date: 20241111204556.4
    record identifier: in00005527119
    language of cataloging:
      language term: eng