rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advanced VLSI design and testability issues
  name:
    name part: Tripathi, Suman Lata.
  name:
    name part: Saxena, Sobhit.
  name:
    name part: Mohapatra, S. K. (Sushanta Kumar)
  name:
    name part: Taylor & Francis
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: flu
    date issued: 2020
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource
  abstract: This bookfacilitates the VLSI-interestedindividuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, includingimage processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2-5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10-13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14-18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation a…
  note: edited by Suman Lata Tripathi, Sobhit Saxena, and Sushanta Kumar Mohapatra.
  note: Includes bibliographical references.
  note: Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc. Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits. S.K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Design and construction
  subject:
    topic: TECHNOLOGY
    topic: Electricity
  subject:
    topic: TECHNOLOGY
    topic: Electronics
    topic: Circuits
    topic: General
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Design and construction
  classification: TK7874.75 .A38 2020
  classification: 621.395
  related item:
    identifier: (OCoLC)1145620437
  identifier: 9781000168174
  identifier: 1000168174
  identifier: 9781003083436
  identifier: 1003083439
  identifier: 9781000168150
  identifier: 1000168158
  identifier: 9781000168167
  identifier: 1000168166
  identifier: 0367492822
  identifier: 9780367492823
  identifier: 9781003083436 Taylor & Francis
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: YDX
    record creation date: 200807
    record change date: 20241108170050.0
    record identifier: in00005526315
    language of cataloging:
      language term: eng