Designing with FPGAs and CPLDs /
Annotation
| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Boca Raton, FL :
CRC Press,
2002.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Table of Contents:
- Cover
- Copyright Page
- Table of Contents
- Foreword
- Preface
- Book Organization
- Intended Audience
- Content
- Support and Feedback
- Acknowledgments
- Chapter 1. Prehistory: Programmable Logic to ASICs
- Objectives
- 1.1 Programmable Read Only Memories (PROMs)
- 1.2 Programmable Logic Arrays (PLAs)
- 1.3 Programmable Array Logic (PALs)
- 1.4 The Masked Gate Array ASIC
- 1.5 CPLDs and FPGAs
- 1.6 Summary
- Exercises
- Chapter 2. Complex Programmable Logic Devices (CPLDs)
- Objectives
- 2.1 CPLD Architectures
- 2.2 Function Blocks
- 2.3 I/O Blocks
- 2.4 Clock Drivers
- 2.5 Interconnect
- 2.6 CPLD Technology and Programmable Elements
- 2.7 Embedded Devices
- 2.8 Summary: CPLD Selection Criteria
- Exercises
- Chapter 3. Field Programmable Gate Arrays (FPGAs)
- Objectives
- 3.1 FPGA Architectures
- 3.2 Configurable Logic Blocks
- 3.3 Configurable I/O Blocks
- 3.4 Embedded Devices
- 3.5 Programmable Interconnect
- 3.6 Clock Circuitry
- 3.7 SRAM vs. Antifuse Programming
- 3.8 Emulating and Prototyping ASICs
- 3.9 Summary
- Exercises
- Chapter 4. Universal Design Methodology for Programmable Devices
- Objectives
- 4.1 What is UDM and UDM-PD?
- 4.2 Writing a Specification
- 4.3 Specification Review
- 4.4 Choosing Device and Tools
- 4.5 Design
- 4.6 Verification
- 4.7 Final Review
- 4.8 System Integration and Test
- 4.9 Ship Product!
- 4.10 Summary
- Exercises
- Chapter 5. Design Techniques, Rules, and Guidelines
- Objectives
- 5.1 Hardware Description Languages
- 5.2 Top-Down Design
- 5.3 Synchronous Design
- 5.4 Floating Nodes
- 5.5 Bus Contention
- 5.6 One-Hot State Encoding
- 5.7 Design For Test (DFT)
- 5.8 Testing Redundant Logic
- 5.9 Initializing State Machines
- 5.10 Observable Nodes
- 5.11 Scan Techniques
- 5.12 Built-In Self-Test (BIST)
- 5.13 Signature Analysis.