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Thermal-aware testing of digital VLSI circuits and systems /

The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips--

Bibliographic Details
Main Author: Chattopadhyay, Santanu (Author)
Corporate Author: Taylor & Francis
Format: eBook
Language:English
Published: Boca Raton : CRC Press, [2018]
Edition:First edition.
Series:CRC focus series.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Integrated circuits > Very large scale integration > Thermal properties.
Temperature measurements.
Circuits intégrés à très grande échelle > Propriétés thermiques.
Thermométrie.
TECHNOLOGY & ENGINEERING > Mechanical.
Digital integrated circuits > Testing
Integrated circuits > Very large scale integration > Testing
Temperature measurements
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips--
Physical Description:1 online resource
Bibliography:Includes bibliographical references and index.
ISBN:9781351227766
1351227769
9781351227773
1351227777
9781351227780
1351227785
9781351227759
1351227750