rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Defects in optoelectronic materials
  name:
    name part: Wada, K. (Kazumi)
    name part: 1950-
    role:
      role term: editor.
  name:
    name part: Pang, Stella W.
    role:
      role term: editor.
  name:
    name part: Taylor & Francis
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: flu
    date issued: 2021
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (380 pages).
  abstract: Defects in Optoelectronic Materials bridges the gap between device process engineers and defect physicists by describing current problems in device processing and current understanding of these defects based on defect physics. The volume covers defects and their behaviors in epitaxial growth, in various processes such as plasma processing, deposition and implantation, and in device degradation. This book also provides graduate students cutting-edge information on devices and materials interaction.
  table of contents: Saturation of Free Carrier Concentration in SemiconductorsThe Amphoteric Defect ModelMaximum Doping Limits in GaAsOther Group III-V SemiconductorsGroup III-NitridesGroup II-VI SemiconductorsGroup I-III-VI2 TernariesOther SemiconductorsUnintentional DopingAmphoteric DopantsPoint Defect Formation Near SurfacesPoint Defect Equilibria near the Semiconductor SurfacesPoint Defect Formation Kinetics in the Sub-Surface Layer - Bottleneck EffectBottleneck Related PhenomenaOptical Characterization of Plasma Etching Induced DamageIon-assisted Etching: Understanding the ProblemOptical Damage Assessment Techniques: Choosing a MethodThe Range of Ion-Induced DamageDry Etch Damage in Widegap Semiconductor MaterialsDamage in the InGaA1N SystemDamage in SiCDamage in II-VI CompoundsGeneration, Removal, and Passivation of Plasma Process Induced Defects Dry Etching SystemsPlasma Process Indu
  note: edited by Kazumi Wada and Stella W. Pang.
  note: Wada, Kazumi
  subject:
    topic: Optoelectronic devices
    topic: Defects
  subject:
    topic: Dispositifs optoélectroniques
    topic: Défauts
  subject:
    topic: SCIENCE / Optics
  subject:
    topic: TECHNOLOGY / Electricity
  classification: TK8304
  classification: 621.38152
  related item:
    title info:
      title: Optoelectronic properties of semiconductors and superlattices ; v. 11
  related item:
    title info:
      title: Defects in Optoelectronic Materials
    name:
      name part: Wada, Kazumi
    origin info:
      publisher: Milton : Taylor & Francis Group,c2001
  identifier: 9780367811297
  identifier: 0367811294
  identifier: 9789056997144
  identifier: 9781000723816
  identifier: 100072381X
  identifier: 9781000719901
  identifier: 1000719901
  identifier: 9781000715996
  identifier: 100071599X
  identifier: 9780367811297 Taylor & Francis
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: TYFRS
    record creation date: 220913
    record change date: 20241108165737.0
    record identifier: in00005523014
    language of cataloging:
      language term: eng