http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
1 online resource (xi, 665 pages, 7 unnumbered pages of plates) : illustrations (some color)
"With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution-focused probe instruments." "The book's unique approach covers both the theoretical and practical knowledge of high-resolution probe-forming instruments. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work." "Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high-resolution probe instrumentation."--Jacket.
Review of ZrO/W Schottky cathode / Lyn W. Swanson, Gregory A. Schwind -- Liquid metal ion sources / Richard G. Forbes, (the late) Graeme L.R. Mair -- Gas field ionization sources / Richard G. Forbes -- Magnetic lenses for electron microscopy / Katsushige Tsuno -- Electrostatic lenses / Bohumila Lencová -- Aberrations / Peter W. Hawkes -- Space charge and statistical coulomb effects / Pieter Kruit, Guus H. Jansen -- Resolution / Mitsugu Sato -- The scanning electron microscope / András E. Vladár, Michael T. Postek -- The scanning transmission electron microscope / Albert V. Crewe; updated by Peter D. Nellist -- Focused ion beams / M. Utlaut -- Aberration correction in electron microscopy / Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt -- Appendix: Computational resources for electron microscopy / J. Orloff; with valuable information from Peter W. Hawkes, Bohumila Lencová.
Includes bibliographical references and index.
Technical & Manufacturing Industries & Trades
Boca Raton : CRC Press/Taylor & Francis, ©2009