rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Handbook of charged particle optics
  name:
    name part: Orloff, Jon
    role:
      role term: editor.
  name:
    name part: Taylor & Francis
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  genre: handbooks.
  genre: Handbooks and manuals
  genre: Handbooks and manuals.
  genre: Guides et manuels.
  origin info:
    place:
      place term: flu
    date issued: 2009
    copyright date: 2009
    edition: 2nd ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xi, 665 pages, 7 unnumbered pages of plates) : illustrations (some color)
  abstract: "With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution-focused probe instruments." "The book's unique approach covers both the theoretical and practical knowledge of high-resolution probe-forming instruments. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work." "Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high-resolution probe instrumentation."--Jacket.
  table of contents: Review of ZrO/W Schottky cathode / Lyn W. Swanson, Gregory A. Schwind -- Liquid metal ion sources / Richard G. Forbes, (the late) Graeme L.R. Mair -- Gas field ionization sources / Richard G. Forbes -- Magnetic lenses for electron microscopy / Katsushige Tsuno -- Electrostatic lenses / Bohumila Lencová -- Aberrations / Peter W. Hawkes -- Space charge and statistical coulomb effects / Pieter Kruit, Guus H. Jansen -- Resolution / Mitsugu Sato -- The scanning electron microscope / András E. Vladár, Michael T. Postek -- The scanning transmission electron microscope / Albert V. Crewe; updated by Peter D. Nellist -- Focused ion beams / M. Utlaut -- Aberration correction in electron microscopy / Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt -- Appendix: Computational resources for electron microscopy / J. Orloff; with valuable information from Peter W. Hawkes, Bohumila Lencová.
  note: edited by Jon Orloff.
  note: Includes bibliographical references and index.
  subject:
    topic: Optical instruments
    topic: Design and construction
    genre: Handbooks, manuals, etc
  subject:
    topic: Electron optics
    genre: Handbooks, manuals, etc
  subject:
    topic: Optique électronique
    genre: Guides, manuels, etc
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Technical & Manufacturing Industries & Trades
  subject:
    topic: Electron optics
  subject:
    topic: Optical instruments
    topic: Design and construction
  subject:
    topic: Teknisk optik
  subject:
    topic: Elektronoptik
  classification: QC372.2.D4 H36 2009eb
  classification: 681/.4
  related item:
    title info:
      title: Handbook of charged particle optics
    origin info:
      publisher: Boca Raton : CRC Press/Taylor & Francis, ©2009
      edition: 2nd ed.
    identifier: (DLC) 2008013026
    identifier: (OCoLC)213765926
  identifier: 9781420045550
  identifier: 1420045555
  identifier: 9781420045543
  identifier: TANDF_188745 Ingram Content Group
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: FXG
    record creation date: 090318
    record change date: 20241108165939.7
    record identifier: in00005522791
    language of cataloging:
      language term: eng