rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Testing for small-delay defects in nanoscale CMOS integrated circuits
  name:
    name part: Goel, Sandeep K.
    role:
      role term: editor.
  name:
    name part: Chakrabarty, Krishnendu
    role:
      role term: editor.
  name:
    name part: Taylor & Francis
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: flu
    date issued: 2014
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xv, 247 pages) : illustrations
  abstract: Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay.
  table of contents: Section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.
  note: edited by Sandeep K. Goel, Krishnendu Chakrabarty.
  note: Includes bibliographical references and index.
  note: English.
  subject:
    topic: Metal oxide semiconductors, Complementary
    topic: Testing
  subject:
    topic: MOS complémentaires
    topic: Essais
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Mechanical
  subject:
    topic: Metal oxide semiconductors, Complementary
    topic: Testing
  classification: TK7871.99.M44 T43 2014eb
  classification: 621.39/732
  related item:
    title info:
      title: Testing for small-delay defects in nanoscale CMOS integrated circuits
    origin info:
      publisher: Boca Raton : CRC Press, 2014
    identifier: (DLC) 2013028538
    identifier: (OCoLC)441142171
  related item:
    title info:
      title: Devices, circuits, and systems
  identifier: 9781439829424
  identifier: 143982942X
  identifier: 9781439829417
  identifier: 1439829411
  identifier: 1315217813
  identifier: 9781315217819
  identifier: 2013028538
  identifier: CL0500000527 Safari Books Online
  identifier: http://proxy.library.tamu.edu/login
  identifier: https://go.oreilly.com/TAMU/library/view/-/9781439829417/
  record info:
    record content source: CUS
    record creation date: 131011
    record change date: 20241108165720.5
    record identifier: in00005522426
    language of cataloging:
      language term: eng