http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SD.
Chapter 1. Introduction -- chapter 2. Detector response function -- chapter 3. Detector artefacts -- chapter 4. Contacts -- chapter 5. Si(Li) x-ray detectors -- chapter 6. HPSi and HPGe x-ray detectors -- chapter 7. X-ray detectors based on silicon lithography and planar technology -- chapter 8. CCD-based x-ray detectors -- chapter 9. Silicon drift x-ray detectors -- chapter 10. Wide bandgap semiconductors -- chapter 11. History of semiconductor x-ray detectors and their applications.
Includes bibliographical references and index.