Cover Image

Handbook of silicon semiconductor metrology /

Bibliographic Details
Corporate Author: Taylor & Francis
Other Authors: Diebold, A. C. (Alain C.)
Format: eBook
Language:English
Published: New York : Marcel Dekker, 2001.
Subjects:
Semiconductors > Measurement.
Semiconductors > Inspection.
Semi-conducteurs > Mesure.
Semi-conducteurs > Inspection.
TECHNOLOGY & ENGINEERING > Electronics > Solid State.
TECHNOLOGY & ENGINEERING > Electronics > Semiconductors.
Semiconductors > Measurement
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Physical Description:1 online resource (xvi, 874 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:0824705068
9780824705060
0585418322
9780585418322
9780203904541
0203904540
9781135554842
1135554846
9781135554798
113555479X
9781135554835
1135554838