Taylor & Francis & Diebold, A. C. (2001). Handbook of silicon semiconductor metrology. Marcel Dekker.
Chicago Style (17th ed.) CitationTaylor & Francis and A. C. Diebold. Handbook of Silicon Semiconductor Metrology. New York: Marcel Dekker, 2001.
MLA (9th ed.) CitationTaylor & Francis and A. C. Diebold. Handbook of Silicon Semiconductor Metrology. Marcel Dekker, 2001.
Warning: These citations may not always be 100% accurate.