rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Integrated circuit quality and reliability
  name:
    name part: Hnatek, Eugene R.
    role:
      role term: creator
  name:
    name part: Taylor & Francis
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nyu
    place:
      place term: New York
    publisher: M. Dekker
    date issued: ©1995
    date issued: 1995
    edition: 2nd ed., rev. and expanded.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xiii, 786 pages) : illustrations
  table of contents: pt. 1. Introduction to integrated circuit manufacturing processes -- pt. 2. Impact of new technologies -- pt. 3. Contamination and manufacturing errors -- pt. 4. Causes (sources) of IC failures -- pt. 5. Introduction to screening.
  note: Eugene R. Hnatek.
  note: Includes bibliographical references and index.
  subject:
    topic: Integrated circuits
    topic: Reliability
  subject:
    topic: Circuits intégrés
    topic: Fiabilité
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Electronics
    topic: Circuits
    topic: Integrated
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Electronics
    topic: Circuits
    topic: General
  subject:
    topic: Integrated circuits
    topic: Reliability
  classification: TK7874 .H535 1995eb
  classification: 621.3815
  related item:
    title info:
      title: Integrated circuit quality and reliability
    name:
      name part: Hnatek, Eugene R.
    origin info:
      publisher: New York : M. Dekker, ©1995
      edition: 2nd ed., rev. and expanded.
    identifier: (DLC) 94033926
    identifier: (OCoLC)31045129
  related item:
    title info:
      title: Electrical engineering and electronics ; 91
  identifier: 0585138605
  identifier: 9780585138602
  identifier: 9781315274041
  identifier: 1315274043
  identifier: 9781482277715
  identifier: 1482277719
  identifier: 0824792831
  identifier: 9780824792831
  identifier: TANDF_377496 Ingram Content Group
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 000807
    record change date: 20241108165338.1
    record identifier: in00005518415
    language of cataloging:
      language term: eng