Industrial applications of surface analysis : based on a symposium jointly sponsored by the Divisions of Industrial and Engineering Chemistry, Colloid and Surface Chemistry, Petroleum Chemistry, and Paper and Textile Chemistry at the 182nd Meeting of the American Chemical Society, New York, New York, August 23-28, 1981 /
| Corporate Authors: | , |
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Washington, D.C. :
American Chemical Society,
1982.
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| Series: | ACS symposium series ;
199. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Table of Contents:
- Surface analysis : prologue and perspective / C.B. Duke
- Ultra-high vacuum techniques of surface characterization / C.R. Brundle
- Analysis of surfaces and thin films by IR, Raman, and optical spectroscopy / D.L. Allara
- Near surface analysis with energetic ion beams / C.R. Gossett
- Characterization of solid surfaces by wet chemical techniques / Frederick M. Fowkes
- Prospects in the analysis of chemically modified electrodes / Dale H. Karweik, Charles W. Miller, Marc D. Porter, and Theodore Kuwana
- Applications of ion beam methods to characterization of adhesive bonding materials / W.L. Baun
- Surface analysis of fibers and polymers by X-ray photoelectron spectroscopy : industrial applications / Merle M. Millard
- Surface analysis of glasses / L.L. Hench and D.E. Clark
- Problems and prospects of instrumental surface analysis of electronic materials and processes / Mary A. Ryan and Gary E. McGuire
- Use of surface analytical techniques to examine metal corrosion problems / D.R. Baer and M.T. Thomas
- Surface characterization in mineral processing / D.W. Fuerstenau and S. Chander
- Particle charge in nonaqueous dispersions / M.L. Hair and D. Landheer
- Surface analysis and solar energy materials / A.W. Czanderna
- Applications of surface analysis in the nuclear industry / N.S. McIntyre
- The surface chemistry of first-wall materials in magnetic fusion devices / H.F. Dylla
- Application of thermal analysis and photoelectron spectroscopy for the characterization of particulate matter / R.L. Dod and T. Novakov.