Desorption mass spectrometry : are SIMS and FAB the same? : developed from a symposium sponsored by 3M, the National Science Foundation Midwest Center for Mass Spectrometry at the University of Nebraska--Lincoln, and the National Science Foundation Regional Facility for Surface Analysis at the University of Minnesota, St. Paul, Minnesota, Oct. 7-10, 1984 /

Bibliographic Details
Corporate Author:	American Chemical Society
Other Authors:	Lyon, Philip A., 1945-
Format:	eBook
Language:	English
Published:	Washington, D.C. : American Chemical Society, 1985.
Series:	ACS symposium series ; 291.
Subjects:	Field desorption mass spectrometry > Congresses. Secondary ion mass spectrometry > Congresses. Spectrométrie de masse par désorption de champ > Congrès. Spectrométrie de masse des ions secondaires > Congrès. SCIENCE > Chemistry > Organic. Field desorption mass spectrometry Secondary ion mass spectrometry Electronic books. Conference papers and proceedings
Online Access:	Connect to the full text of this electronic book

Table of Contents:

Molecular secondary ion mass spectrometry / Steven J. Pachuta and R. Graham Cooks
Particle bombardment as viewed by molecular dynamics / Barbara J. Garrison
Role of intermolecular interactions in the desorption of molecular ions from surfaces / Ronald D. Macfarlane
Processes of laser-induced ion formation in mass spectrometry / F. Hillenkamp, M. Karas, and J. Rosmarinowsky
Angle-resolved secondary ion mass spectrometry / Nicholas Winograd
Secondary ion mass spectrometer design considerations for organic and inorganic analysis / C.W. Magee
Liquid metal ion sources / Douglas F. Barofsky
Fast atom bombardment mass spectrometry technique and ion guns / Julius Perel
Fast atom bombardment secondary ion mass spectrometry surface analysis / J.A. Leys
Secondary ion mass spectrometry : a multidimensional technique / Richard J. Colton, David A. Kidwell, George O. Ramseyer, and Mark M. Ross
Fast atom bombardment combined with tandem mass spectrometry for the study of collisionally induced remote charge site decompositions / Nancy J. Jensen, Kenneth B. Tomer, Michael L. Gross, and Philip A. Lyon
Analysis of reactions in aqueous solution using fast atom bombardment mass spectrometry / Richard M. Caprioli
Applications of fast atom bombardment in bioorganic chemistry / Dudley H. Williams
Use of secondary ion mass spectrometry to study surface chemistry of adhesive bonding materials / W.L. Baun.