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Atlas of forensic pathology : a pattern-based approach /

Bibliographic Details
Main Authors: Kemp, Walter L. (Author), Hughes, Rhome (Author), Barnard, Jeffrey J. (Author)
Format: Book
Language:English
Published: Philadelphia : Wolters Kluwer, [2024].
Subjects:
Forensic pathology.
Autopsy.
MEDICAL / Pathology.
Description
Physical Description:xxiv, 675 pages : color illustrations ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9781975222505
1975222504