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Microstructures of surfaces, using interferometry

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Bibliographic Details
Main Author:	Tolansky, S. (Samuel), 1907-1973 (Author)
Format:	Book
Language:	English
Published:	New York, American Elsevier Pub. Company [1968]
Subjects:	Interferometry. Surfaces (Technology) Microstructure. Interferometry Interférométrie. Surfaces (Technologie) Microstructure (Physique) microstructure. Surfaces (Technology), Interferometers.

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