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Local resistance measurement for degradation of c-Si heterojunction with intrinsic thin layer (HIT) solar modules : preprint /

Bibliographic Details
Main Author: Jiang, C.-S. (Chun-Sheng) (Author)
Corporate Author: United States. Department of Energy (sponsoring body.)
Format: Government Document eBook
Language:English
Published: Golden, CO : National Renewable Energy Laboratory, August 2020.
Series:Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5K00-76041.
Subjects:
Electric resistance > Measurement.
Solar panels > Technological innovations.
Thin films > Electric properties.
Heterojunctions > Research > United States.
Online Access:https://purl.fdlp.gov/GPO/gpo193469

Internet

https://purl.fdlp.gov/GPO/gpo193469

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Holdings details from Available Online
Call Number: E 9.17:NREL/CP-5 K 00-76041
 
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E 9.17:NREL/CP-5 K 00-76041 Available