Local resistance measurement for degradation of c-Si heterojunction with intrinsic thin layer (HIT) solar modules : preprint /

Bibliographic Details
Main Author: Jiang, C.-S. (Chun-Sheng) (Author)
Corporate Author: United States. Department of Energy (sponsoring body.)
Format: Government Document eBook
Language:English
Published: Golden, CO : National Renewable Energy Laboratory, August 2020.
Series:Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5K00-76041.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/gpo193469

MARC

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100 1 |a Jiang, C.-S.  |q (Chun-Sheng),  |e author. 
245 1 0 |a Local resistance measurement for degradation of c-Si heterojunction with intrinsic thin layer (HIT) solar modules :  |b preprint /  |c Chun-Sheng Jiang [and 6 others]. 
264 1 |a Golden, CO :  |b National Renewable Energy Laboratory,  |c August 2020. 
300 |a 1 online resource (5 pages) :  |b color illustrations. 
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500 |a In scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP). 
500 |a "August 2020." 
500 |a "Presented at the 47th IEEE Photovoltaic Specialists Conference (PVSC 47), June 15-August 21, 2020"--Cover. 
500 |a GPO Cataloging Record Distribution Program (CRDP). 
504 |a Includes bibliographical references (page 5). 
536 |b DE-AC36-08GO28308 
588 |a Description based on online resource; title from PDF title page (NREL, viewed February 23, 2021). 
650 0 |a Electric resistance  |x Measurement. 
650 0 |a Solar panels  |x Technological innovations. 
650 0 |a Thin films  |x Electric properties. 
650 0 |a Heterojunctions  |x Research  |z United States. 
710 2 |a National Renewable Energy Laboratory (U.S.),  |e issuing body. 
710 1 |a United States.  |b Department of Energy,  |e sponsoring body. 
830 0 |a Conference paper (National Renewable Energy Laboratory (U.S.)) ;  |v NREL/CP-5K00-76041. 
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